Effect of extended defects on phonon confinement in polycrystalline Si and Ge films ChemRxiv

Larisa V. Arapkina, Kirill V. Chizh, Oleg V. Uvarov, Valery V. Voronov, Vladimir P. Dubkov, Mikhail S. Storozhevykh, Maksim V. Poliakov, Lidiya S. Volkova, Polina A. Edelbekova, Alexey A. Klimenko, Alexander A. Dudin, Vladimir A. Yuryev Effect of extended defects on phonon confinement in polycrystalline Si and Ge films ChemRxiv
DOI: 10.26434/CHEMRXIV-2024-W4VGB.